Thermal stability of silicon carbonitride ceramics derived from different organo-silicon precursors
The microstructure evolution of the precursor-derived SiCN ceramics upon exposure at temperatures between 1000 and 1500 ℃ was investigated by Fourier transform infrared spectroscopy (FTIR), highresolution transmission electron microscopy (HRTEM), electron-energy-loss spectra (EELs), and X-ray diffraction (XRD). The results of the present study indicated that the SiCN materials converted from amorphous station to crystalline structure above 1400 ℃. The ceramics was composed of crystalline hexagonal α-Si3N4, SiaNzO. At 1500 ℃, oxygen in the sintering furnace was introduced during annealing, thus crystalline SiO2 was also found in some of the ceramic materials. The microstructure evolution in the three chlorosilanes derived system is similar except that earlier crystallization in hexyl- and benzyl-derived ceramics than ethyl-derived ceramic materials.
SiCN ceramics trichlorosilanes thermal stability crystallization
CHENG Huijie LI Yali Kroke Edwin
Key Laboratory of Advanced Ceramics and Machining Technology, Tianjin University, Tianjin 300072, Ch Key Laboratory of Advanced Ceramics and Machining Technology, Tianjin University, Tianjin 300072, Ch Institute of Inorganic Chemistry, Technology University Bergakademie Freiberg, Freiberg 09596, Germa
国际会议
The 3rd Asian Conference on Molten Salts and Ions Liquids 2011(第三届亚洲熔盐与离子液体会议)
哈尔滨
英文
71-74
2011-01-06(万方平台首次上网日期,不代表论文的发表时间)