Optimal Burn-in for n-Subpopulations with Stochastic Degradation

摘要：

Often within any population of components there are strong and weak subpopulations, most notably in advanced electronic products. Burn-in test is often used to eliminate the early failures and reduce the warranty cost for those devices. This paper considers a burn-in process for a degradation-based heterogeneous population. An optimization model is formulated to achieve the optimal burn-in time. Numerical examples are provided to demonstrate the effectiveness of the burn-in process.

关键词： burn-in heterogeneous population Brownian motion with drift

作者: Yisha XIANG David W. COIT Qianmei FENG

作者单位: Department of Management Science School of Business Sun Yat-Sen University Guangzhou, China Industri Industrial and Systems Engineering Department Rutgers University Piscataway, USA Department of Industrial Engineering University of Houston Houston, USA

会议类型: 国际会议

会议名称: 2011 International Conference on Quality,Reliability,Risk,Maintenance,and Safety Engineering(2011年质量、可靠性、风险、维修性与安全性国际会议暨第二届维修工程国际学术会议 ICQR2MSE 2011)

会议地点: 西安

会议语种:英文

页码: 154-158

在线出版日期: 2011-06-17（万方平台首次上网日期，不代表论文的发表时间）