Comparison of Two Quality Control Models for Short Run Process Based on Bayesian Analysis

摘要：

In dealing with the problem of establishing control limits in short run production, Bayesian approach provides a effective way for are short run process control and are particularly attractive. In this paper, two quality control models for short run process are presented based on Bayesian analysis and the two models are compared. Models are focused on normally distributed data. The first way to establish model is through the posterior density of mean and variance of normally distributed data respectively and the second way is through the posterior predictive density. And the results deduced from two different ways are compared.

关键词： SPC Bayesian analysis posterior distribution

作者: Qinwen HUANG Wenxiao FANG Jian LIU

作者单位: Science and Technology on Reliability Physics and Application of Electronic Component Laboratory CEPREI Laboratories Guangzhou, China

会议类型: 国际会议

会议名称: 2011 International Conference on Quality,Reliability,Risk,Maintenance,and Safety Engineering(2011年质量、可靠性、风险、维修性与安全性国际会议暨第二届维修工程国际学术会议 ICQR2MSE 2011)

会议地点: 西安

会议语种:英文

页码: 248-250

在线出版日期: 2011-06-17（万方平台首次上网日期，不代表论文的发表时间）