The Application Research of Neural Network in Embedded Intelligent Detection
Neural network which can adapt the sample data by training has good fault-tolerance and can be used in the field of intelligence widely. In the embedded system, restricted to the resources and the capacity of processor, the neural network application has a series of problems, such as losing timelines and the system could be collapsed easily. This article discusses how to use limited memory, processor and external equipment resources to achieve the neural network algorithm for improving the universality of detection system and adaptive ability in the embedded intelligent measuring system.
Neural Network Embedded System Intelligent Detection.
Xiaodong Liu Dongzhou Ning Hubin Deng Jinhua Wang
Compute Center of Nanchang University, 330039, Nanchang, Jiangxi, China East China Jiaotong University, 330039, Nanchang, Jiangxi, China
国际会议
南昌
英文
376-381
2010-10-22(万方平台首次上网日期,不代表论文的发表时间)