Studies of the degradation mechanisms in high power diode lasers

摘要：

The main failure mechanisms of high power diode lasers such as material defects, mirror damage and solder related failures as well as to methods which significantly suppress the occurrence of catastrophic failure and solder related failures are investigated in this paper. Meanwhile, in order to obtain the lifetime data of high power QCM cm-bar arrays, we have set up an automated diode array reliability experiment to examine the characteristics of high power QCW cm-bar arrays over time, and aging test results up to 2.0×109 shots at 25 °C will be reported.

作者: Lu Guoguang Huang Yun Lei Zhifeng

作者单位: CEPREI, Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,Guangzhou, 510610, China

会议类型: 国际会议

会议名称: 2011 International Symposium on Advanced Packaging Materials(2011年先进电子封装材料国际会议APM)

会议地点: 厦门

会议语种:英文

页码: 80-84

在线出版日期: 2011-10-25（万方平台首次上网日期，不代表论文的发表时间）