AN OPTIMAL N-DETECTION TESTS GENERATION METHOD

摘要：

N-detection test is an important detection method to increase defect coverage and assurance quality of product, the disadvantage of this test set is that it constitutes a lot of test vectors. The low bonder on the size of the of N-detection test set is N times the size of the independent fault set(IFS).this theory is the basis of this paper. We first used the traditional ATPG to generate a M-detection (M > N) test set that each fault can detect at least M times, then the test sets static compacted by ILP algorithm and obtained the minimum test set for any given N. The time cost of ILP depends on the size of constraint matrix and the quality of the original test set(M-detection test set), reducing the dimension of constraint matrix and improving the quality of the original test set is the focus of this paper.

关键词： IC Testing N-detection test ATPG fault simulation ILP

作者: GAIYOU HUANG JISHUN KUANG

作者单位: College of Information Science and Engineering, Hunan University Changsha, China

会议类型: 国际会议

会议名称: 3rd International Conference on Mechanical and Electrical Technology(ICMET2011) (2011第三届机械与电气技术国际会议)

会议地点: 大连

会议语种:英文

页码: 551-556

在线出版日期: 2011-08-26（万方平台首次上网日期，不代表论文的发表时间）