Effect of content on microstructure of PI/TiO2 hybrid Films
A small-angle x-ray scattering (SAXS) technique using synchrotron radiation as the x-ray source has been employed to characterize the microstructure of PI/TiO3 hybrid films prepared by Sol-Gel method. It is shown that the SAXS profile is hardly constant with Porods law showing a negative and positive slope, suggesting that an interfacial layer exists between the nanoparticles and PI matrix in films when content of more than 5%. This suggests that the inorganic nanoparticles linked to the PI matrix through covalent bond. However, the only positive deviation exists in the film of content 5%. The reason is that there is a fluctuation of electron density in hybrid system. This kind of material has also been proved to possess both surface and mass fractal structures.
component Polyimide /TiO2 content SAXS
Xiaoxu Liu WU Yan Jinghua Yin Minghua Chen Yu Feng Guang Li
Center for engineering training and basic experimentation,Heilongjiang Institutes of Science and Tec Center for engineering training and basic experimentation,Heilongjiang Institutes of Science and Tec School of Applied Science,Harbin University of Science and Technology,Harbin,China
国际会议
The 6th International Forum on Strategic Technology(IFOST 2011)(第六届国际战略技术论坛)
哈尔滨
英文
230-232
2011-08-22(万方平台首次上网日期,不代表论文的发表时间)