High power LED thermal performance test analysis and its research methods

摘要：

High-power LED thermal resistance characteristics, the overall temperature distribution and using heat dissipation method all have significant impacts on the reliability of the LED work but there is no effective measuring method in production practice. In this paper, we use infrared thermal imaging technology to get IW high power LED transient thermal field map. Through visual means, we can clearly observe the overall high power LED thermal field distribution. Accordingly, the impact of the overall temperature distribution of LED on its thermal design and reliability will be discussed. At the same time, it also proves that the infrared thermal imaging technology can be used as an effective means of high-power LED thermal testing and analysis.

关键词： High power LED Infrared thermal imaging Thermal analysis

作者: Hong min Wang Haibo Li Hua Chen Yu Cao

作者单位: College of Automation,Harbin University of Science and Technology,Harbin China,150080

会议类型: 国际会议

会议名称: The 6th International Forum on Strategic Technology(IFOST 2011)(第六届国际战略技术论坛)

会议地点: 哈尔滨

会议语种:英文

页码: 517-520

在线出版日期: 2011-08-22（万方平台首次上网日期，不代表论文的发表时间）