A Fast Age Distribution Convergence Mechanism in an SSD Array for Highly Reliable Flash-based Storage Systems
SSDs are now popular choice for large data storage compared to HDDs due to their promising features such as no moving parts, shock/temperature resistance and low power etc. On the other hand the fast growth in flash technology brings major data reliability concerns which need to be addressed. In multi-level cell (MLC) NAND flashes the Bit Error Rate (BER) increases exponentially with reduced endurance limit as compare to single-level cell (SLC) NAND flashes. In future this trend can significantly decrease the data reliability of flash-based storage systems.
SSD array NAND flash data reliability high-assurance storage RAID BER.
Irfan F. Mir Alistair A. McEwan
Department of Engineering, University of Leicester,Leicester, LE2 7RH Department of Engineering,University of Leicester,Leicester, LE2 7RH
国际会议
西安
英文
521-525
2011-05-13（万方平台首次上网日期，不代表论文的发表时间）