An Investigation Into The Effect Of The Bias Line On The Insertion Loss Of RF-MEMS Tunable Filter

摘要：

Explicit design formulae to describe the effect of the bias line on the insertion loss of RF-MEMS tunable filter are presented at first in this paper. Afterwards, a five-order RF-MEMS tunable filter using five identical MEMS capacitance networks is designed and simulated to justify the proposed formulae. From the design example, it is seen that the insertion loss of the filter increased from -7dB to -5dB when the resistance of the bias line varies from Ikii to 8kΩ. Finally, the bias line with meander-line shape is introduced in this paper to increase the resistance of the bias line.

关键词： RF-MEMS tunable filter capacitance network bias line insertion loss

作者: Cheng Tu Jingfu Bao Yijia Du

作者单位: Department of Electronic Engineering, University of Electronic Science and Technology of China,Chengdu, 611731, PRC

会议类型: 国际会议

会议名称: 2011 China-Japan Joint Microwave Conference(2011年中日微波会议CJMW 2011)

会议地点: 杭州

会议语种:英文

页码: 429-432

在线出版日期: 2011-04-20（万方平台首次上网日期，不代表论文的发表时间）