A component inspection algorithm based on low-dimensional image feature

摘要：

The images captured by image-array-based automatic optical inspection devices may be inconsistent in lightness, definition and uniformity, which greatly influence the accuracy of the inspection result. To solve such a problem, a component inspection algorithm based on low-dimensional image feature is proposed. It doesnt compare inspected image with standard image from pixel to pixel like traditional algorithms do. Instead it compares key image feature extracted from the image by designing feature functions and computing attributes. The essential of the algorithm is to transfer the original highdimensional information contained within the image to one-dimensional feature data. Experiments show that the algorithm can ensure efficient and low-storage real-time component inspection.

关键词： Automatic optical inspection Image array Image feature Component inspection

作者: Jianjie Wu Yuhui Zhang

作者单位: School of Software Engineering Huazhong University of Science and Technology Wuhan, Hubei, 430074, China

会议类型: 国际会议

会议名称: Third International Conference on Digital Image Processing(ICDIP 2011)(第三届数字图像处理国际会议)

会议地点: 成都

会议语种:英文

页码: 581-586

在线出版日期: 2011-04-15（万方平台首次上网日期，不代表论文的发表时间）