EDS, XRD and Raman scattering study of Dy ion implanted CdTe polycrystalline thin films

摘要：

Dysprosium (Dy) ion implanted CdTe polycrystalline thin film (PTF) deposited on the ceramic substrate by the close spaced sublimation (CSS) method. Both the energy dispersive X-ray spectrometer (EDS) and Raman scattering analysis show that the as-deposited and Dy ion implanted CdTe PTF are non-stoichiometric with excess telluride. Furthermore, X-ray diffraction study reveals that the CdTe PTF forms a zinc-blended structure. In the Raman scattering analysis, the position of the peak on implantation does not change apparently whereas the intensity of the peak decreases owing to the lattice damage and increases as a result of thermal annealing. The data support that Raman activity is enhanced after Dy ion implantation.

关键词： CdTe ion implantation X-ray diffraction Raman scattering

作者: Juan Hou Hai Bin Cao Xu Chu Huang Chun Yan Song

作者单位: Key Laboratory of Ecophysics and Department of Physics, Teachers College,Shihezi University, Xinjian Key Laboratory of Ecophysics and Department of Physics, Teachers College,Shihezi University, Xinjian

会议类型: 国际会议

会议名称: 2011 International Conference on Advanced Material Research(ICAMR 2011)(2011年先进材料研究国际会议)

会议地点: 重庆

会议语种:英文

页码: 157-160

在线出版日期: 2011-01-21（万方平台首次上网日期，不代表论文的发表时间）