Mechanical and Electrical Characterization of Nanowires in Scanning Electron Microscope
The characterization of mechanical and electrical properties of nanowires often requires positioning and imaging capabilities at the nanoscale. Nanomanipulation inside a scanning electron microscope (SEM) is a suitable approach for this purpose. This paper presents two experimental techniques for mechanical and electrical characterization of individual nanowires. Tensile testing is realized by transferring a nanowire to a microelectromechanical systems (MEMS) device that stretches the nanowire and measures the elongations and tensile forces. Four-point probe measurement is achieved by landing four nanomanipulators on a nanowire with visual guidance from SEM. This work represents advances in nanomaterial testing and automated nanomanipulation.
Changhai Ru Yong Zhang Lining Sun Yu Sun
Robotics and Microsystems Center, Soochow University, China Advanced Micro and Nanosystems Laboratory, University of Toronto, Canada
国际会议
长春
英文
1-4
2011-08-29（万方平台首次上网日期，不代表论文的发表时间）