Cutting Assembled Carbon Nanotubes with Atomic Force Microscope for Fabrication of Nanoelectrodes

摘要：

This paper first presents a new fabrication method for CNT nanoelectrode pairs by combining the DEP and AFM lithography. The single CNT is driven and electrically connected with the microeletrodes by the DEP force, and then cut into nanoeletrode pairs through the AFM tip. The fabricated CNT nanoeletrode pairs can be used as probes to detect species in micro-environment and applied in electrochemical sensors.

作者: Zengxu Zhao XiaojunTian Ke Xu Zaili Dong

作者单位: State Key Lab.of Robotics, Shenyang Institute of Automation, Chinese Academy of Sciences

会议类型: 国际会议

会议名称: The First International Conference on Manipulation,Manufacturing and Measurement on the Nanoscale(第一届3M-NANO国际会议)

会议地点: 长春

会议语种:英文

页码: 1-4

在线出版日期: 2011-08-29（万方平台首次上网日期，不代表论文的发表时间）