SMD Resistor Defect Detection Based on Gray Projection Adaptive Matching
This paper describes gray projection adaptive matching, a fast flaw detection method for SMD (Surface Mounted Devices) resistor, according to the characteristics of resistor surface image. The detection would be defected through computing matching coefficient of two nearby resistance units image, avoiding the limitations of the traditional detection template matching, as makes the algorithm suitable for certain image with the shortcomings unbalanced illumination, zoom, rotation and distortion. The projection, converting 2d images into one-dimensional image, greatly reduces matching computational complexity, decreasing the cost of matching calculation. Experiments on SMD resistance show that compared with traditional template matching method, detection speed by the proposed algorithm prossessing a strong anti-jamming ability and good robustness increases an order of magnitude and more about 18.6% accuracy.
Chen Liguo Zhao Mingxuan Li Maohai Sun Lilin
Robotics and Microsystems Center, Soochow university, Suzhou, China State Key Laboratory of Robotics and System, Harbin Institute of Technology, Harbin, China
国际会议
长春
英文
1-5
2011-08-29（万方平台首次上网日期，不代表论文的发表时间）