A new measurement method and electrical design for high density optoelectronics integration
This paper describes a parallel test method based on a cross-point switch which can be programmed to control signal path and the number of switches to be opened according to the number of channels to be tested. In this method, at the transmitting side, one source inputted crosspoint switch can be fan-out to multi sources to activate device under test, and different signal trace or length of cables can change phases between multi sources. At the receiving side, all output channels are connected to another RF switch controlled to choose output channel. These two switches both are controlled by software. Multi channels working together will help evaluating cross talk between channels and SSN noise test. In this paper, to ensure test accuracy, signal integrity of DUT and test system is designed and simulated. And an 8-channel optical transceiver is tested using this method and cross talk and power noise are especially showed and analyzed. The test results indicate this test method can meet parallel optical transmission test requirement and other optical module and electrical module test; however the cost is greatly lower than high speed test instruments.
Fengman Liu Kun Yang Liqiang Cao Lixi Wan Baoxia Li Yunyan Zhou Wei Gao Haifei Xiang Haidong Wang Jian Song Zhihua Li Kun Yang
Institute of Microelectronics, Chinese Academy of Science, Beitucheng West road 3#，Chaoyang Distrcit, Beijing, China,100029
国际会议
上海
英文
699-702
2011-08-08（万方平台首次上网日期，不代表论文的发表时间）