Study on the Reliability of High-power LEDs under Temperature Cycle
High-power LEDs have been widely used and have a big potential market due to the many advantages compared to conventional light sources. Reliability is one of the most important issues for the application of LEDs. In order to study the degradation mechanism and the stability of LED withstanding cyclical exposures to temperature variations, life test was carried out under temperature cycle testing. The experiment was designed basing on the EIAJ ED-4701/100. Four groups of 1 W high power LEDs adopting different material and structures were utilized. The temperature cycle accelerated life test under the condition of -25℃/125℃. After the accelerated test, the optical performance of the four kinds of devices were compared and analyzed, and the thermal performance of the LEDs was also tested, analyzed and discussed. At last, the reliability differences of high-power LEDs were analyzed and degradation mechanism of high power LEDs under temperature cycling was discussed.
Fan Huang Luqiao Yin Shuzhi Li Guangming Xu Huafeng Yan Yu Chen Lianqiao Yang Jianhua Zhang
Key Laboratory of Advanced Display and System Applications (Shanghai University),School of Mechatron Key Laboratory of Advanced Display and System Applications (Shanghai University Shanghai Research Center of Eengineering and Technology for Semiconductor Lighting Shanghai Yaming Lighting co., Ltd.Ministry of Education.P.O.B 143, 149 Yanchang Rd., Shanghai Univer Key Laboratory of Advanced Display and System Applications (Shanghai University),School of Mechatron
国际会议
上海
英文
1120-1123
2011-08-08（万方平台首次上网日期，不代表论文的发表时间）