Preparation and Characterization of BiFeO3 Film via Sol-gel Spin-Coating Process
BiFeO3 thin fIlms were spin-coated on conductive indium tin oxide (ITO)/glass substrates by a simple sol-gel possess annealed at 470-590℃. The crystal structure of as-prepared BiFeO3 thin films annealed at different temperature was determined to be rhombohedral of R3m space and free of secondary phases was also confirmed. Cross section scanning electron microscope (SEM) pictures revealed that the thickness of BiFeO3 thin film was about 320 nm. The double remanent polarization 2Pr of BiFeO3 thin film annealed at 500℃ is 2.5 μC/cm2 without applied field at room temperature. Image of atomic force microscopy indicated that the root-mean-square surface roughness value of BiFeO3 thin film was 6.13 nm.
Xiwei Qi Xiaoyan Zhang XuaN Wang Haibin Sun Jianquan Qi
Department of Materials Science and Engineering, Northeastern University at QinHuangDao Branch, QinHuangDao 066004, P.R.China
国际会议
长沙
英文
202-205
2011-06-30（万方平台首次上网日期，不代表论文的发表时间）