Investigation of a SPR waveguide sensor based on angular interrogation

摘要：

A novel angular interrogation SPR waveguide sensor based on SOI material is theoretically investigated. The parameters of the sensor such as the thickness of Au and Ti film are optimized.

作者: Shiqi Fan Mingyu Li Jian-Jun He

作者单位: Center for Integrated Optoelectronics, State Key Laboratory of Modern Optical Instrumentation,Zhejiang University, Hangzhou, PR China, 310027

会议类型: 国际会议

会议名称: Asia Communications and Photonics Conference and Exhibition(2010亚洲光纤通信与光弹博览会及研讨会 ACP 2010)

会议地点: 上海

会议语种:英文

页码: 471-472

在线出版日期: 2010-12-08（万方平台首次上网日期，不代表论文的发表时间）