Fabrication of La0.85Na0.15Mn1-xNixO3 (0≤x≤0.2) thin films on LaAlO3 substrates via chemical solution deposition

摘要：

Epitaxial La0.85Na0.15Mn1-xNixO3 (0≤x≤0.2) thin films are fabricated successfully on LaAlO3 (LAO) (100) substrates using chemical solution deposition method. The results reveal that with the increase of the Ni-doping content, the x-ray diffraction intensity ratio of I(111)/I(200) increases, whereas both the grain size and the roughness decrease. The magnetic and transport measurements show that it is effective to tune the MR effects via Ni doping at Mn-sites.

作者: Liu Shengman Bian Yadong Wang Tingtai Yang Linfeng Sun Xiaowei Zhang Jingchang

作者单位: Zhongyuan University of Technology, Zhengzhou 450007, P.R.China

会议类型: 国际会议

会议名称: The 6th International Conference on Physical and Numerical Simulation of Materials Processing(第六届材料与热加工物理模拟及数值模拟国际学术会议 ICPNS 2010)

会议地点: 桂林

会议语种:英文

页码: 1-6

在线出版日期: 2010-11-16（万方平台首次上网日期，不代表论文的发表时间）