STUDY OF MICROSTRUCTURE OF POLYOCTYLFLUORENE THIN FILM AND ITS EFFECT ON ELECTRO-OPTIC PROPERTIES BY USING GRAZING INCIDENT X-RAY DIFFRACTION
Polyoctylfluorene (PFO) is an extensively studied blue light-emitting organic semiconductor that polymorphism has been observed. Four different crystalline or liquid crystalline phases, a, a,p and nematic (N) phase, have been identified in its powder, fiber and thick film.. However the microstructures of PFO thin films and its effect on electro-optic properties are not well studied yet. Here we characterize the microstructures by using grazing incident X-ray diffraction (GIXRD) and study its effect on photoluminescence (PL) and electroluminescence (EL). Figure 1 shows the normal X-ray diffraction (XRD) pattern and GIXRD pattern of β phase and a phase PFO thin film achieved by exposure to toluene vapour and annealing at 140℃ for 30 minutes. The results demonstrate that GIXRD can eliminate the background and substrate signal and then clearly show the diffraction pattern of PFO thin film.
Jidong Zhang Xi Chen He Wan Junqiao Ding Zhiyuan Xie Lixiang Wang Zhishen Mo
State Key Lab of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, Changchun,130022, R.R.China
国际会议
PP’2010，Jinan International Symposium on Polymer Physics(2010济南国际高分子物理学术研讨会)
济南
英文
164-165
2010-06-06（万方平台首次上网日期，不代表论文的发表时间）