Progress and extension of nanomechanical properties mapping to viscoelasticity measurement

摘要：

While most practical polymeric materials have higher structure inside with a variety of components, conventional mechanical testingmethods give only single properties to each materials, giving no direct information about the internal distribution of mechanical properties. We have been focusing on atomic force microscopy (AFM) with the aim of achieving direct observation of the inhomogeneity of microscopic mechanical properties. We established nanomechanical properties mapping method, in which force-distance curves are measured at various points of the sample surface and elastic properties given by the curve and elastic mechanics model are mapped as a two dimensional image

作者: So Fujinami Dong Wang Hao Liu Ken Nakajima Toshio Nishi

作者单位: WPI Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan

会议类型: 国际会议

会议名称: PP’2010，Jinan International Symposium on Polymer Physics(2010济南国际高分子物理学术研讨会)

会议地点: 济南

会议语种:英文

页码: 223-224

在线出版日期: 2010-06-06（万方平台首次上网日期，不代表论文的发表时间）