NANOMECHENICAL MAPPING ON DEFORMED SEMICRYSTALLINE POLYMERS

摘要：

The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties, enable us to investigate the elasticity, hardness, Hamaker constant, adhesion

作者: HAO LIU DONG WANG SO FUJINAMI KEN NAKAJIMA TOSHIO NISHI

作者单位: WPI ADVANCED INSTITUTE FOR MATERIALS RESEARCH, TOHOKU UNIVERSITY 2-1-1 KATAHIRA, AOBA-KU, SENDAI

会议类型: 国际会议

会议名称: PP’2010，Jinan International Symposium on Polymer Physics(2010济南国际高分子物理学术研讨会)

会议地点: 济南

会议语种:英文

页码: 290-291

在线出版日期: 2010-06-06（万方平台首次上网日期，不代表论文的发表时间）