会议专题

NANOMECHENICAL MAPPING ON DEFORMED SEMICRYSTALLINE POLYMERS

The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties, enable us to investigate the elasticity, hardness, Hamaker constant, adhesion

HAO LIU DONG WANG SO FUJINAMI KEN NAKAJIMA TOSHIO NISHI

WPI ADVANCED INSTITUTE FOR MATERIALS RESEARCH, TOHOKU UNIVERSITY 2-1-1 KATAHIRA, AOBA-KU, SENDAI

国际会议

PP’2010,Jinan International Symposium on Polymer Physics(2010济南国际高分子物理学术研讨会)

济南

英文

290-291

2010-06-06(万方平台首次上网日期,不代表论文的发表时间)