会议专题

STRUCTURAL DEPENDENCE OF ELECTRIAL TRANSPORT PROPERTIES OF THERMALLY EVAPORATED CdSe THIN FILMS

Structural analysis of thermally evaporated and heat treated CdSe thin films were done by X-ray diffraction technique and values of some of the structural parameters like lattice constant, grain size, microstrain, dislocation density etc were calculated. The I-V characteristics of the films were studied in a gap type cell configuration with Aluminium electrodes. In the same configuration the electrical transport properties of the films were investigated and the calculations of activation energies and mobility activation energies were done for the films having structural variations.

Structural Parameters Activation Energies

Kangkan Sarmah Ranjan Sarma Hira Lal Das

Department of Physics, Mangaldai College, Mangaldai – 784125, Assam, India Department of Physics, Tezpur University,Tezpur – 784028, Assam, India

国际会议

The Ninth Asian Thermophysical Properties Conference(第九届亚洲热物理性能会议 ATPC 2010)

北京

英文

389-396

2010-10-19(万方平台首次上网日期,不代表论文的发表时间)