DEVELOPMENT OF A HIGH ACCURACY LASER INTERFEROMETRIC DILATOMETER OVER THE TEMPERATURE RANGE FROM 300K to 1200K
A high accuracy laser interferometric dilatometer with a resolution of less than 1 nm has been developed in the National Institute of Metrology, China. This instrument is based on a single frequency polarized interferometer. The disadvantage of the single frequency procedure is that the zero may drift with time. In order to improve the stability, we developed a procedure to correct the effect of this drift, to ensure the stability of the device within 1nm. The performance of the new device has been examined by measuring some reference materials. The Standard Reference Material 738 of the National Institute of Standard and Technology was measured over the temperature range from 300K to 770K. The measured linear Expansion Coefficient agreed with the NIST values within a relative deviation less than 1.7％. A silicon specimen was measured over the range from 770 K to 1200 K, and the measurement results were in good agreement with the recommended values by the Committee on Data for Science and Technology 8,9. And the combined standard deviation of the experimental data is less than 6×10-8 from 300K to 800℃.
Linear Expansion Coefficient Laser Interferometer SRM738
J. P. Sun J.Q.Liu
National Institute of Metrology (NIM), Beijing, China, 100013 HeBei University, BaoDing, China, 071002
国际会议
The Ninth Asian Thermophysical Properties Conference(第九届亚洲热物理性能会议 ATPC 2010)
北京
英文
1044-1050
2010-10-19（万方平台首次上网日期，不代表论文的发表时间）