THERMAL CONDUCTIVITY MODELS FOR THIN FILM STRUCTURES
Firstly, a simple model for the evaluation of the electron effective mean free path (MFP) in thin metal films is proposed, and the thermal conductivities of aluminum and copper thin films are predicted based on this model by solving the Boltzmann transport equation (BTE). In the modeling of the electron effective MFP, the combined contributions of the bulk MFP and the film MFP are taken into account. The proposed effective electron MFP model is incorporated with the gray version of BTE through the Transport relaxation time. The present model is verified against the experimental thermal conductivity data as a function of the film thickness. Secondly, the thermal conductivity models for both amorphous and crystalline of Ge2Sb2Te5 (GTS) phase-change materials are proposed using a modified version of the M-S model. The structural parameters of the original M-S model are extended to describe the additional scattering effects caused by the ternary component of the GST. From the thermal models, the effect of an alloy composition on a grain boundary scattering is discussed.
Joon Sik Lee Jae Sik Jin
School of Mechanical & Aerospace Engineering Seoul National University Seoul 151-744, Korea Micro Thermal System Research Center Seoul National University Seoul 151-744, Korea
国际会议
The Ninth Asian Thermophysical Properties Conference(第九届亚洲热物理性能会议 ATPC 2010)
北京
英文
1269-1273
2010-10-19（万方平台首次上网日期，不代表论文的发表时间）