会议专题

Preparation and Characterization of Ultrasonic Electrodeposited Copper Coating

Copper has replaced aluminum as the main interconnect material in VLSI, due to its low resistivity and high electromigration resistance. The property of copper coating is a key factor that determines the reliability of interconnects. A special copper coating was prepared by ultrasonicelectrodeposition method in this study, and the microstructure, hardness, wear resistance, adhesion and corrosion resistance of it were investigated respectively. Test results show that the crystallite size of it is obviously smaller than that of the ordinary electrodeposited copper coating, and the hardness, wear resistance, adhesion and corrosion resistance of it are all evidently enhanced.

Ronghong Cui Yuting He Zhiming Yu Wenjun Shu Jinqiang Du

Engineering College, Air Force Engineering University, Xi’an, 710038, China State Key Lab. For Corro Engineering College, Air Force Engineering University, Xi’an, 710038, China State Key Lab. for Corrosion and Protection, Institute of Metal Research, Chinese Academy of Science

国际会议

2010 11th International Conference on Electronic Packaging Technology & High Density Packaging(2010 电子封装技术与高密度封装国际会议)

西安

英文

847-850

2010-08-16(万方平台首次上网日期,不代表论文的发表时间)