Statistical method of modeling and optimization for wireless sensor nodes with different interconnect technologies and substrates
A comparison study was carried out between a wireless sensor node with a bare die flip-chip mounted and its reference board with a BGA packaged transceiver chip. The main focus is the return loss (S parameter S11) at the antenna connector, which was highly depended on the impedance mismatch. Modeling including the different interconnect technologies, substrate properties and passive components, was performed to simulate the system in Ansoft Designer software. Statistical methods, such as the use of standard derivation and regression, were applied to the RF performance analysis, to see the impacts of the different parameters on the return loss. Extreme value search, following on the previous analysis, can provide the parameters’ values for the minimum return loss. Measurements fit the analysis and simulation well and showed a great improvement of the return loss from -5dB to -25dB for the target wireless sensor node.
Liqiang Zheng Alan Mathewson Brendan OFlynn Michael Hayes Cian OMathuna
Tyndall National Institute, Lee Maltings, Prospect Row, Cork, Ireland
国际会议
西安
英文
860-865
2010-08-16（万方平台首次上网日期，不代表论文的发表时间）