Analysis of Application Status about Microwave Devices

摘要：

The analysis of failure status on microwave devices in recent years have been analysed in this paper. Statistic distribution of sort and the main failure mechanisms on microwave devices in application have been obtained. And correspond control methods were introduced.

作者: Ping Li Xiao-Ying Cui Ping Lai

作者单位: The Fifth Research Institute of MIIT,National Key Laboratory of Science and Technology on Reliability Physics and Application of Electronic Component Dong Guang Zhuang Road Number 110,Tian He District,Guang Zhou,Guang Dong,China

会议类型: 国际会议

会议名称: 2010 11th International Conference on Electronic Packaging Technology & High Density Packaging(2010 电子封装技术与高密度封装国际会议)

会议地点: 西安

会议语种:英文

页码: 965-967

在线出版日期: 2010-08-16（万方平台首次上网日期，不代表论文的发表时间）