The Methodology of Life Prediction and Validation of Electronic Products Based on Accelerated Degradation Testing
Life prediction is one of the newly arisen key technology for promoting the reliability and quality of electronic products. But, the effect of the prevalent life prediction methods is not satisfactory; most of them are on the stage of theoretical research and lack of engineering practicability. In this paper, a methodology of life prediction based on accelerated degradation testing is introduced. According to the presented methodology, the accelerated model and degradation model can be obtained by the testing, and the life distribution of electronic products can be extrapolated. And also, a validation methodology of life prediction of electronic products based on performance accelerated degradation testing is proposed. In this paper, the engineering practicability of the presented methodology is verified with a case of electronic part in certain avionics system.
Mengmeng Liu Zhanyong Ren Yun Fu Dandan Liu Zhaoyang Zeng
The Center of Quality Engineering, China Avic Aero-polytechnology Establishment China Avic Aero-polytechnology Establishment, No.7, Jingshun Road, Chaoyang District, Beijing 100028, China
国际会议
西安
英文
1053-1058
2010-08-16（万方平台首次上网日期，不代表论文的发表时间）