An EMF Activity Tree Based BPEL Defect Pattern Testing Method

摘要：

For testing BPEL defects efficiently,a novel BPEL defect pattern testing architecture based on the EMF activity tree technology is proposed. The EMF activity tree that is similar to abstract syntax tree is used to describe the BPEL service process structure. The mapping method from the DOM object tree of a BPEL file to the EMF activity tree and the recursive algorithm to generate an EMF activity tree are represented in detail. A typical EMF activity tree is shown and the visitor design pattern based traversal method is stated. The directions to enhance this technology are illustrated finally.

关键词： EMF activity tree:defect pattern:BPEL

作者: Junfei Huang Yunzhan Gong

作者单位: State Key Laboratory of Networking and Switching Technology Beijing University of Posts and Telecommunications Beijing,China

会议类型: 国际会议

会议名称: 2010 2nd International Conference on Computer Engineering and Technology(2010年第二届计算机工程与技术国际会议 ICCET 2010)

会议地点: 成都

会议语种:英文

页码: 4696-4699

在线出版日期: 2010-04-16（万方平台首次上网日期，不代表论文的发表时间）