BIT Optimization Design of Airborne Electronic Equipment Based on Reliability

摘要：

Built-in test (BIT) has direct or indirect influence on reliability, maintainability, availability, lifecycle cost of the airborne electronic equipment. In this paper, we present a BIT optimization design approach based on the reliability. The impact of BIT on the system reliability is analyzed, and the BIT optimization design approach is mainly discussed. In the following, the NLIP (Non-Linear Integer Programming) model of the BIT optimization design is addressed, a demonstration results show that the system reliability and the performance of the BIT design are improved by the proposed approach.

作者: MA Cun-bao WANG Yan-wen ZHANG Wei SHI Hao-shan

作者单位: School of Aeronautics Northwestern Polytechnical University Xian,710072,CHINA School of Electronics and Information Northwestern Polytechnical University Xian,710072,CHINA

会议类型: 国际会议

会议名称: The 2nd International Symposium on Systems and Control in Aeronautics and Astronautics(第二届航空航天系统与控制国际会议 ISSCAA 2008)

会议地点: 深圳

会议语种:英文

页码: 1250-1253

在线出版日期: 2008-12-10（万方平台首次上网日期，不代表论文的发表时间）