The Ⅰ-Ⅴ Measurement System for Solar Cells Based on MCU
In this paper, an Ⅰ-Ⅴ measurement system for solar cells based on Single-chip Microcomputer (MCU) is presented. According to the test principles of solar cells, this measurement system mainly comprises of two parts—data collecting, data processing and displaying. The MCU mainly used as to acquire data, then the collecting results is sent to the computer by serial port. The Ⅰ-Ⅴ measurement results of our test system are shown in the human-computer interaction interface based on our hardware circuit. By comparing the test results of our Ⅰ-Ⅴ tester and the results of other commercial Ⅰ-Ⅴ tester, we found errors for most parameters are less than 5％, which shows our Ⅰ-Ⅴ test result is reliable. Because the MCU can be applied in many fields, this Ⅰ-Ⅴ measurement system offers a simple prototype for portable Ⅰ-Ⅴ tester for solar cells.
Chen Fengxiang Ai Yu Wang Jiafn Wang Lisheng
Department of physics science and technology, Wuhan University of Technology, Wuhan city, Hubei Province,China,430070
国际会议
3rd International Photonics & OptoElectronics Meetings(第三届国际光子与光电子学会议 POEM 2010)
武汉
英文
1-4
2010-11-03（万方平台首次上网日期，不代表论文的发表时间）