The influence of La content on properties of PLZT thin films

摘要：

The polycrystalline complex compounds of PLZT, the formula (Pb1-xLax)(Zr0.52Ti0.48)O, (x = 0.10, 0.15, 0.20 and 025), were fabricated by sol-gel method, the influence of La content on the microstructure, optical properties and electrical properties of PLZT materials were studied. Phase characterization and crystal orientation of the PLZT films was investigated by X-ray diffraction analysis. The extinction coefficient k of the films drops dramatically in the range of 300-500 nm, and reduces to 0.0355,0.0357 and 0.0451 with the La concentration of 15％, 20％ and 25％, respectively, when the wavelength is larger than 550 nm. The remnant polarization of the films decreases with the La content increasing.

作者: Qian Sun Hongmei Deng Xiaoxi Li Pingxiong Yang Junhao Chu

作者单位: Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of electronics, Eas Key Laboratory for Material Microstructures of Shanghai University, Shanghai University, 99 Shangda

会议类型: 国际会议

会议名称: 3rd International Photonics & OptoElectronics Meetings(第三届国际光子与光电子学会议 POEM 2010)

会议地点: 武汉

会议语种:英文

页码: 1-5

在线出版日期: 2010-11-03（万方平台首次上网日期，不代表论文的发表时间）