Surface profile measurement by terahertz interferometric phase imaging

摘要：

We demonstrate an interferometric phase imaging technique by using a continuous-wave terahertz system with a far-infrared gas laser as the radiation source. A terahertz Michelson interferometer is constructed based on a reflection imaging system. By analyzing the measured fringe patterns, the phase distribution information can be obtained and then used to reconstruct the profile of the object surface under test. We also show that, for imaging a nearly transparent object with terahertz radiation, our technique can provide a high contrast image which would be quite valuable for accurate identification of the examined object.

作者: Yingxin Wang Ziran Zhao Zhiqiang Chen Li Zhang Jingkang Deng

作者单位: Department of Physics, Tsinghua University, Beijing, 100084, China Key Laboratory of Particle & Radi Key Laboratory of Particle & Radiation Imaging (Tsinghua University), Ministry of Education, Departm Department of Physics, Tsinghua University, Beijing, 100084, China

会议类型: 国际会议

会议名称: 3rd International Photonics & OptoElectronics Meetings(第三届国际光子与光电子学会议 POEM 2010)

会议地点: 武汉

会议语种:英文

页码: 1-5

在线出版日期: 2010-11-03（万方平台首次上网日期，不代表论文的发表时间）