Test Points Selection for Analog Fault Diagnosis Using Immune Clonal Selection Algorithm
The problem of test point selection is important in the area of fault diagnosis and circuit testing. In this paper, a method based on immune clonal selection algorithm (ICSA) and integer-coded fault dictionary is proposed for selecting the optimum test points of analog circuits. The problem of test points selection is transformed into the selection of dictionary columns to isolate the rows by using integer-coded fault dictionary. Then, the ICSA-based method was used to find the optimum test points. In the end of this paper, the presented approach is illustrated by a practical example of analog circuit and statistical experiments. The experimental results indicate that the proposed method is easier to find the global optimum test points with acceptable time consumption. Compared with GA-based method, this method has fewer parameters to set.
analog fault diagnosis test points selection fault dictionary immune clonal selection algorithm
Haisong Liu Jiechang Wu
Department of Mechanical Engineering Naval University of Engineering Wuhan, China
国际会议
成都
英文
906-909
2010-12-17（万方平台首次上网日期，不代表论文的发表时间）