VLSI Architecture of Defect Feature Extraction Based on Wavelet Packet in Ultrasonic Nondestructive Test

摘要：

This paper aims at the construction of VLSI architecture of defect extraction based on wavelet packet decomposition. The wavelet packet decomposition for defect feature extraction of ultrasonic signal in nondestructive test is discussed. Based on the features being extracted from decomposed coefficients at different scales and levels, the frame of defect feature extraction is confirmed. The VLSI architectures of wavelet packet decomposition and feature extraction algorithms are configured. The architectures are implemented in FPGA. According to the implementations in FPGAs and experiments to defects classification, the VLSI architecture of defect feature extraction provides a practical and effective solution to real-time embedded reconfigurable ultrasonic signal processing applications.

关键词： VLSl architecture wavelet packet feature exuaction

作者: Liu Shoushan Zhang Tongjun Bi Lijun Tao Anli

作者单位: College of Information and Electrical Engineering Shandong University of Science and Technology Qingdao, China

会议类型: 国际会议

会议名称: 2010 2nd International Conference on Signal Processing System(2010年信号处理系统国际会议 ICSPS 2010)

会议地点: 大连

会议语种:英文

页码: 14-17

在线出版日期: 2010-07-05（万方平台首次上网日期，不代表论文的发表时间）