The Applicaion of Photoelectric Inspecting Technique in Yarn Defect Test

摘要：

A new method of yarn defect detection using the structure character of yarn image and the Photoejectric Inspecting Technique is provided. Hardware schematic diagram was given, as well as the operating principle of the system. Jt can be proved that this system has good qualities of simplicity, reliability and high ratio of capability to price, and it can transmit the yarn defect image information to host computer with the USB interface in time. After the secondary development of virtual oscillograph DS0-2902, the control of whole inspection system was achieved, and calculation results can be saved and displayed on computer. The secondary development provides better human computer interface for the inspection system. The experimental result confirms that the proposed method can is feasible in rapid defect detection.

关键词： photoelectric inspecting yarn defect data acquisition image processing

作者: XU Guo-sheng

作者单位: Information and Control Engineering College, Weifang University 261061 Weifang, China

会议类型: 国际会议

会议名称: 2010 2nd International Conference on Signal Processing System(2010年信号处理系统国际会议 ICSPS 2010)

会议地点: 大连

会议语种:英文

页码: 276-279

在线出版日期: 2010-07-05（万方平台首次上网日期，不代表论文的发表时间）