Analog circuit fault diagnosis combing wavelet packet with higher order statistics

摘要：

An approach to fault diagnosis for analog circuit is described in this paper, which uses wavelet packets transform and higher order statistics (HOS) method to extract fault features and SVM classifiers to classify faults. Firstly, output voltage signals are obtained from the test nodes and the fault feature vectors are extracted using wavelet packets transform and HOS method. Then, the fault feature vectors are feed to SVM for classification. Simulation results of diagnosing a four op-amp high pass filter show us the proposed method has the higher classification accuracy and bave confirmed the validity of the proposed method.

关键词： analog circuit fauLt diagnosis wavelet packet transform higher order statistics support vector machine

作者: SHEN HONG TANG JINGYUAN CHEN XIQU KONG XIAOHONG

作者单位: Mechamcal and Elecffical Department Henan Institute of Science and Technology Xinxiang, China 95774 troops of PLA Chengdu, china Mechanical and Electrical Department Henan Institute of Science and Technology Xinxiang, China

会议类型: 国际会议

会议名称: 2010 2nd International Conference on Signal Processing System(2010年信号处理系统国际会议 ICSPS 2010)

会议地点: 大连

会议语种:英文

页码: 368-371

在线出版日期: 2010-07-05（万方平台首次上网日期，不代表论文的发表时间）