A Fast Combined Fault Diagnosis Approach Based on LWSVM

摘要：

To fast monitor process, a combined approach of fault diagnosis approach based on Lifting Wavelets and SVM(LWSVM) was presented. Firstly the data was pre processed to remove noise and spikes through lifting scheme wavelets, which is faster than the traditional wavelets. Then SVM was used to diagnose the faults in process. To validate the performance and effectiveness of the proposed scheme, LWSVM was applied to diagnose the faults in TE Process. The results were given to show the effectiveness of these improvements for fault diagnosis performance in terms of low computational cost and high fault diagnosis accuracy.

关键词： Lifting waveLets Fault detection and diagnosis LWSVM TE process

作者: Dongsheng Wu Qing Yang Feng Tian Dazhi Wang

作者单位: School of Information Science and engineering Shenyang Ligong University Shenyang, China College of School of Information Science and engineering Shenyang Ligong University Shenyang, China College of Optical and electronical Changchun University of Science and Technology Changchun, China

会议类型: 国际会议

会议名称: 2010 2nd International Conference on Signal Processing System(2010年信号处理系统国际会议 ICSPS 2010)

会议地点: 大连

会议语种:英文

页码: 932-935

在线出版日期: 2010-07-05（万方平台首次上网日期，不代表论文的发表时间）