Test Selection of Complex Electronic System based on Small World Network and Improved Particle Swarm Optimization

摘要：

Currently fault propagation characteristics of small-world network have caused widespread concern among scholars, especially in the areas of Electronic System. In this paper we proposed an algorithm based on small world network and improved particle swarm optimization for solving test selection problems. It has been successfully applied to Radar transmitter system. We analyze the characteristics of small-world network and fault propagation, and use the discrete particle swarm optimization to find the shortest path of fault propagation. The proposed method could be used for setting fault test point and failure prevention. It is particularly useful for finding fault propagation and selecting test points in complex electronic system.

关键词： test point selection fault propagation particle swarm Optimization DFT.

作者: Zhang Huijie Tian Shulin Liu Zhen

作者单位: School of Automation Engineering University of Electronic Science and Technology of China,Chengdu 610054,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 266-270

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）