Implementation of Full Jitter Performance Test in High-speed Serial Links with ATE

摘要：

To quantify the transmission quality of HSIO efficiently and accurately is a big challenge in front of SoC ATE test engineers. The common BIST loopback method is easy to setup and time-saving but can not promise an acceptable confidence level for current faster and faster high-speed devices. On the other hand, to fully measure jitter related specs with industry standard instruments will lead to excessive cost of test (e.g., capital investment, time-to-market, test time). This paper proposes one solution for at-speed jitter performance testing on ATE, which covers jitter histogram, random jitter/deterministic jitter separation and jitter spectrum decomposition (stardust). This solution has been implemented in production of real devices and the result shows its high accuracy and cost effectiveness.

关键词： jitter test with ATE RJ DJ Spectrum decomposition (stardust)

作者: Lu Ming

作者单位: Application Development Center,Verigy Co. Ltd.,Shanghai 201203,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 381-386

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）