Development of Open Architecture Test Systems

摘要：

Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.

关键词： open architecture ATE ATE software technologies application-oriented

作者: Tang Diyin Yu Jinsong Chen Xiongzi Wang Honglun

作者单位: School of Automation Science and Electrical Engineering,Beihang University,Beijing 100191,China Unmanned Aerial Vehicle Institute,Beihang University,Beijing 100191,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 400-403

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）