Study on Modular Design for Microwave High Power Automatic Test System

摘要：

The current difficulty of the microwave high power test is introduced. Modular design of hardware, software and system are especially studied. A universal platform solution for the automated testing of microwave high-power multi-parameter problems is provided, which has been verified in a real Microwave High Power Automatic Test System(MHPATS). These works are useful explorations on the road to meet the increasing correlative test requirements.

关键词： modular design microwave high power automatic test system

作者: Guo Min Zhao Xiucai

作者单位: Science and Technology on Electronic Test & Measurement Laboratory,Qingdao 266000,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 448-452

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）