Thickness precision measurement method of sheath and insulation materials based on image processing

摘要：

Subpixel is a key technology of image processing technology. It can achieve positioning better than entire pixel precision to the target. Against the shortcoming of slow speed of general Zernike moment subpixel location method, proposed an improved Sobel-Zernike moment positioning method in the software algorithms of sheath and insulation materials thickness image measurement system, improved the edge point criterion and the edge subpixel coordinates formula, optimized the edge of a single pixel contour, achieved precise and rapid measurements, and the experiment display is faster than 80％.

关键词： image processing sub-pixel Sobel- Zernike moment method Sheath insulation materials.

作者: Xia Shulan Wang Jilin

作者单位: Yancheng Institute of Technology,Department of Experiment Teaching,Yancheng ,China Yancheng Institute of Technology,College of Information Engineering,Yancheng,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 753-757

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）