Design and Implementation of a Test System for a New QDUC

摘要：

With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) –AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.

关键词： test system QUDC AD9957 MCU CPLD.

作者: Yang Shouguo Zhang Kunhui Li Yong Tang Weiping Gao Xiang

作者单位: School of Electronic and Information,Northwestern Polytechnical University,Xian 710072,China;The Mi School of Electronic and Information,Northwestern Polytechnical University,Xian 710072,China The Missile Institute of Air Force Engineering University,Sanyuan 713800,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 829-832

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）