Fault Feature Exaction Method for the Circuit Based on Haar Wavelet Filter Banks

摘要：

According to features of analog circuit test response with pseudo random stimulus signal, fault feature exaction method for the circuit based on wavelet filter banks is presented in the paper. The frequency spectral of the test response signal is decomposed into some parts equably or unequally by Haar wavelet filter banks. Comparing each sub-band signal of response of the different circuit faults, we can find the sub-band with the maximal difference among different fault responses. The fault feature exaction is achieved by the maximal difference sub-band. Because the test response is addressed in different band, fault character exaction method based on wavelet filter group has high precision and high resolving power for parametric fault.

关键词： wavelet filter banks analog circuit fault feature exaction

作者: Meng Xianguo Li Jimin Feng Bing Yang Zhen

作者单位: Ordnance Engineering College,Shijiazhuang 050003,China Baicheng Ordnance Test Center of China,Baicheng 137001,China Army 63726,Yinchuan 750000,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 1218-1222

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）