会议专题

Fault Feature Exaction Method for the Circuit Based on Haar Wavelet Filter Banks

According to features of analog circuit test response with pseudo random stimulus signal, fault feature exaction method for the circuit based on wavelet filter banks is presented in the paper. The frequency spectral of the test response signal is decomposed into some parts equably or unequally by Haar wavelet filter banks. Comparing each sub-band signal of response of the different circuit faults, we can find the sub-band with the maximal difference among different fault responses. The fault feature exaction is achieved by the maximal difference sub-band. Because the test response is addressed in different band, fault character exaction method based on wavelet filter group has high precision and high resolving power for parametric fault.

wavelet filter banks analog circuit fault feature exaction

Meng Xianguo Li Jimin Feng Bing Yang Zhen

Ordnance Engineering College,Shijiazhuang 050003,China Baicheng Ordnance Test Center of China,Baicheng 137001,China Army 63726,Yinchuan 750000,China

国际会议

2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

成都

英文

1218-1222

2011-08-16(万方平台首次上网日期,不代表论文的发表时间)