Interconnect resources testing and faults diagnosis in field programmable gate arrays

摘要：

This paper presents a testing method of the interconnect resource (IR) for Field programmable gate arrays (FPGAs) which takes the programmable switch boxes (SBs) as the core of faults testing and diagnosis by mapping faults to their corresponding configurable logic blocks (CLBs). CLBs in FPGA have also been employed to enhance driving capability. The proposed technology can achieve 100％ test coverage of the SB faults in IRs, as well as precisely identify the fault type and locate faults. An in-house developed FPGA test system based on SOC hardware/software verification technology has been applied to test XC4000E family of Xilinx. The experiment results revealed that the IRs in FPGA can be tested by 6 test patterns with test vectors.

关键词： FPGA Switch box CLB IR testing Fault diagnosis

作者: Liao Yongbo Ruan Aiwu Wang Yu Xiang Chuanyin Wang Lin Huang Haocheng Zhu Jianhua

作者单位: State key Laboratory of Electronic Thin Films and Integrated Devices University of Electronic Science & Technology of China Chengdu 610054,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 1285-1289

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）