Analyses and Solutions to Unsafe Testing States from Boundary Scan Testing

摘要：

IEEE 1149.1 standard provides an effictive approach to testing circuit boards with physical limited access. Unsafe testing states may be occurred during the duration of boundary scan testing when both design-for-testing on circuit board and testing script are not perfect. Case studies on unsafe testing states occurred in the duration of boundary scan testing is provided based on our testing work performed over the recent years, reasons are analysed and solutions are proposed.

关键词： boundary scan testing unsafe testing state analysis solution.

作者: Deng Xiaopeng Xu Simao

作者单位: Software Engineering Center,Electronic Engineering Institute,Hefei 230037,China;Department of Comput Software Engineering Center,Electronic Engineering Institute,Hefei 230037,China

会议类型: 国际会议

会议名称: 2011 10th International Conference on Electronic Measurement & Instruments(第十届电子测量与仪器国际会议 ICEMI2011)

会议地点: 成都

会议语种:英文

页码: 1296-1299

在线出版日期: 2011-08-16（万方平台首次上网日期，不代表论文的发表时间）