Reliability Analysis of Electrical Connector Contacts Based on Accelerated Degradation Tests by Vibration Stress

摘要：

Taking the two kinds of contacts of JY599I circular electrical connector as the subject, this paper applied two directions of vibration stress, horizontal and vertical, to practice the accelerated degradation tests. Taking the contact resistance as the degradation data, we can get the expected value of degradation data of contact resistance at each moment based on the hypothesis that the degradation data of contact resistance at each moment obeys the Normal distribution. Thus, we can get the pseudo life under different stress by fitting the degradation data path. After the poly-fitting of the pseudo life of the two kinds of contacts in horizontal and vertical direction, the contact life under normal operation conditions can be obtained.

关键词： Electrical connector contact resistance vibration stress degradation test

作者: SHUNONG ZHANG YINING CHEN BO SUN RUIK ANG MINGSHENG LU

作者单位: School of Reliability and Systems Engineering, Beihang University, Beijing, 100191, P.R. China China Aviation Optical-Electrical Technology Co, LTD (JONHON), Henan, 471003, P.R. China

会议类型: 国际会议

会议名称: The 7th Inyernational Conference on Mathematical Methods in Reliability:Theory,Methods,Applications(第七届国际可靠性数学、理论、方法与应用会议 MMR2011)

会议地点: 北京

会议语种:英文

页码: 59-65

在线出版日期: 2011-06-20（万方平台首次上网日期，不代表论文的发表时间）